Examining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely and comprehensive overview of SPM applications, now that industr...
This volume will examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004 and the second to fourth volumes in e...
This volume will examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004 and the second to fourth volumes in e...
This volume will examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004 and the second to fourth volumes in e...
The recent emergence and proliferation of proximal probes, e.g. SPM and AFM, and computational techniques for simulating tip-surface interactions has enabled the systematic investigation of interfacia...
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapt...
Since 2004, "The Springer Handbook of Nanotechnology" has established itself as the definitive reference in the nanoscience and nanotechnology area. It integrates the knowledge from nanofabrication, n...