Microscopy of Semiconducting Materials 2003

This text contains writings from the thirteenth conference on the Microscopy of Semiconducting Materials, which focused on international developments in semiconductor studies carried out by all forms of microscopy. Modern electronic devices rely on ever greater miniaturization of components, and semiconductor processing is approaching the domain of nanotechnology. Studies of devises in this regime can only be carried out with the most advanced forms of microscopy. Accordingly, this text provides an overview of the latest instrumentation, analysis techniques and state-of-the-art advances in semiconducting materials science for solid state physicists, chemists and material scientists.